We offer a wide range of consumables for every scanning electron microscope (SEM). Specifically, we provide chamber holding systems for SEMs (SEM stubs), appropriate adapters (SEM stub adapters), adapters for SEM stages (SEM stub adapters), sample holders of various shapes and sizes (SEM holders), consumables/accessories for tabletop SEMs, consumables/accessories for transmission electron microscopes (TEM), consumables/accessories for FIB (Focused Ion Beam), for AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope), cryo systems, light microscopy, and optical calibration.

Additionally, we supply filaments/cathodes/sources for TEM, consumables/accessories for sample coating systems, thermal evaporation sources, conductive tapes, carbon stickers, and conductive pastes for use during sample placement and observation in SEMs, substrates, sample storage boxes, vacuum/inert gas storage accessories, tweezers, sensors, engraving tools, pipettes, lab cutting tools/razors, laboratory gloves, sample preparation stands for SEM, preparation surfaces, small hand tools, and vacuum consumables/accessories.