The revolutionary profile of Rtec Instruments' optical profilometers can easily analyze any surface. Simply zoom in on the images and measure profilometry characteristics from nm to mm on a single machine platform. As a result, RTEC’s optical systems investigate atomic structures with a single click. Additionally, the optical profilometers measure roughness, waviness, film thickness, and perform chemical property mapping. This integrated approach to surface profiling represents an innovation in surface technology.
The 3D optical profilometers offer nanometer-level analysis, are advanced in technology, modular, and robust in construction, while providing automated profilometry in both measurement and analysis. You may choose from the available high-resolution 3D optical profilometers on the market, which combine many optical imaging techniques into one platform. You can measure roughness, step height, texture, geometry, thickness, and many other properties for any material.
UP-2000 White Light Interferometer
UP-2000 White Light Interferometer is a fully automated optical microscope that is cost-effective and highly accurate. The UP-2000 model features high-speed cameras with nanometer resolution. A flexible vertical range, high accuracy across roller stages, and a rigid design make the UP-2000 WLI (White Light Interferometer) microscopes an ideal choice for measuring roughness, step height, film thickness, and topography analysis of any sample.
Main Features
UP-3000 3D Optical Profilometer
Confocal + Interferometer + Dark Field + Variable Focus + Bright Field Imaging
The model UP-3000 is a truly general-purpose model of advanced stable optical profilometry. Featuring five imaging functions in one 3D profilometer (Confocal, Interferometer, Darkfield, Variable Focus, Bright Field Imaging), the UP-3000 is a top-quality microscope. The technology, performance, high accuracy, resolution, and versatility of the 3D optical profilometer UP-3000 create a unique class of instruments. Equipped with fast scanning and high resolution, it offers the best solution for precision control.
Main Features
UP-5000 3D Optical Profilometer
Interferometer + Confocal + Spectral Film Thickness + Dark Field + Variable Focus + AFM + Raman
The UP-5000 model is a comprehensive optical 3D profilometer designed for observing large samples with precision and ease, offering 6-in-1 optical profilometry image analysis (Interferometer, Confocal, Spectral Film Thickness, Dark Field, Variable Focus, AFM - Atomic Force Microscope, and Raman). The technology, performance, resolution, and versatility of the UP-5000 make it the number one instrument in its category worldwide. Equipped with fast scanning, multiple imaging techniques, and high resolution, the UP-5000 provides the best solution for imaging large sample surfaces.
