Optical Microscopes

Inverted metallographic microscopes ECLIPSE MA200 & ECLIPSE MA100N

The ECLIPSE MA200 & ECLIPSE MA100N inverted metallographic microscopes from NIKON METROLOGY, Japan, are versatile, modular observation systems designed for reflective optical contrast techniques in combination with digital imaging accessories. These models are ideal for metallurgical/metallographic sample observation and have a wide range of applications, including the examination of metallic samples such as aluminum, copper, steel, Zn, Ti, and other alloys. The samples for observation generally need to undergo complete metallographic preparation, which includes perfect grinding, polishing, and chemical etching.

  • Inverted metallographic microscopes suitable for observing the microstructure of metals and other materials
  • Designed for reflective optical contrast techniques in combination with digital imaging accessories
  • Ideal models for metallographic applications on samples of aluminum, copper, steel, Zn, Ti, and other metal alloys
  • Full compatibility with NIKON METROLOGY cameras and NIS ELEMENTS image analysis software

Upright Microscopes ECLIPSE LV150NA & LV150N

The ECLIPSE LV150NA and LV150N models from NIKON METROLOGY are versatile, modular upright microscopes, ideal for various reflective optical contrast techniques such as Brightfield (BF), Darkfield (DF), DIC (Differential Interference Contrast), Polarization (POL), Fluorescence, and Interferometry. Accompanied by the appropriate digital imaging accessories and an extended XY stage, they are perfectly suited for the observation of semiconductors as well as for analyzing the microstructure of metallographic samples, which need to undergo specific metallographic preparation including grinding, polishing, and chemical or electrolytic etching.

Main features

  • Upright microscopes suitable for observing the microstructure of metals, semiconductors, minerals, plastics and other materials
  • Designed for various reflective optical contrast techniques such as Brightfield (BF), Darkfield (DF), DIC, Polarization (POL), and Fluorescence Interferometry
  • Ideal for metallographic sample analysis
  • Fully compatible with NIKON METROLOGY cameras and NIS ELEMENTS image analysis software
Image

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